Scanning Electron Microscope (SEM)

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A Scanning Electron Microscope (SEM) uses a focused beam of electrons to analyze a surface at the nanoscale and generally use secondary electron (SE) detectors or backscattered electrons (BSE) detectors to image samples to very high magnifications. AAA's SEM is a JEEOL JCM-7000 with 100K magnification and fully embedded EDS and real-time software analysis

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